Scanning Probe Microscopy

Leader: Alain Ranguis

Introduction

The mission of the Scanning Probe Microscopy Service is to image and characterize materials and nanostructures at the nanoscale.

Scanning Probe microscopy responds to the growing need of the various research axes of the CINaM to add a 3-dimensional observation tool. It is an important service of the CINaM for all research related to surface physics, growth mechanisms and nanosciences.

In addition, it provides the possibility of characterizing at the nanometric scale the physical (electrical, mechanical, magnetic...) and chemical behaviour of new materials or components.

The service is referenced by the CNRS REMISOL network (REseau MIcroscopies à SOndes Locales).

It is open to researchers, PhD students and trainees in the laboratory and remains an essential support for the Ingénierie Moléculaire et Matériaux Fonctionnels (IMMF), NanoMatériaux (NM) et Sources et Sondes Ponctuelles (SSP) departments.

Service microscopie à champ proche 5
3D image of monoatomic steps of the Si(111) 7x7 surface reconstruction obtained by scanning tunneling microscopy in constant current imaging mode. S=40x40 nm².
The service is equipped with:

2 Scanning Tunneling Microscopes (STM) :

  • Omicron LT STM-Qplus (Low Temperature)
  • Omicron VT STM (Variable Temperature)

2 Atomic Force Microscopes (AFM):

  • Digital Instruments NanoScope III
  • PSIA XE-100

The two AFM sets are complementary in terms of sample sizes and resolutions.

Service microscopie à champ proche 4
Atomic resolution of a KCl surface obtained by atomic force microscopy in non-contact mode at 77K.
Service microscopie à champ proche 3
Self-assembly of octyloxy-bis-pyrene derivative molecules on Au(111) obtained by scanning tunneling microscopy at 77K.

Group leader

Patents

  • Procédé de croissance de films minces monocristallins sur wafer de saphir

069 // STEPPHIRE - Réf/CNRS : DI11692-01 - Réf/AMU : 18D051 - Dépôt de la demande de brevet européen.