Franck Jandard
electronique, microscopie champ proche, SNOM
2019
High spatial resolution inorganic scintillator detector for high energy X-ray beam at small field irradiation
S.B.C Debnath, Agnes Tallet, S. Lavandier, Sree Bash, Chandra Debnath, C. Fauquet, Agnès Tallet, Anthony Gonçalves, S Ebastien Lavandier, F. Jandard, D. Tonneau, Julien Darréon
Medical Physics (2019)10.1002/MP.14002 
2013
Spatial resolution of confocal XRF technique using capillary optics
M. Dehlinger, C. Fauquet, S. Lavandier, O. Aumporn, F. Jandard, V. Arkadiev, A. Bjeoumikhov, D. Tonneau
Nanoscale Research Letters 8:UNSP 271 (2013)10.1186/1556-276X-8-271
Toward sub-micro-XRF working at nanometer range using capillary optics
M. Dehlinger, C. Fauquet, F. Jandard, A. Bjeoumikhova, R. Gubzhokov, A. Erko, I. Zizak, D. Pailharey, S. Ferrero, B. Dahmani, D. Tonneau
X-Ray Spectrometry 42:456-461 (2013)
Mapping of X-ray induced luminescence using a SNOM probe
F. Jandard, C. Fauquet, M. Dehlinger, A. Ranguis, A. Bjeoumikhov, S. Ferrero, D. Pailharey, B. Dahmani, D. Tonneau
Applied Surface Science 267:81-85 (2013)
2012
Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy
M. Dehlinger, C. Dorczynski, C. Fauquet, F. Jandard, D. Tonneau, A. Bjeoumikhov, S. Bjeoumikhova, R. Gubzhokov, A. Erko, I. Zizak, D. Pailharey, S. Ferrero, B. Dahmani
International Journal of Nanotechnology 9:460-470 (2012)10.1504/IJNT.2012.045348
2011
Combining scanning probe microscopy and X-ray spectroscopy
C. Fauquet, M. Dehlinger, F. Jandard, S. Ferrero, D. Pailharey, S. Larcheri, R. Graziola, J. Purans, A. Bjeoumikhov, A. Erko, I. Zizak, B. Dahmani, D. Tonneau
Nanoscale Research Letters 6:308 (2011)10.1186/1556-276X-6-308
2008
X-ray excited optical luminescence detection by scanning near-field optical microscope : a new tool for nanoscience
S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola, A. Kuzmin, J. Purans
Review of Scientific Instruments 79:013702 (2008)
Electrical conductivity of ultra-thin silicon nanowires
N. Rochdi, D. Tonneau, F. Jandard, H. Dallaporta, V. Safarov, J. Gautier
Journal of Vacuum Science and Technology 26:159-163 (2008)
Fabrication and electrical properties of ultra-thin silicon nanowires
N. Rochdi, D. Tonneau, F. Jandard, H. Dallaporta, V. Safarov
physica status solidi (a) 205:1157-1161 (2008)
2006
X-Ray studies on optical and structural properties of ZnO nanostructured thin films
S. Larcheri, C. Armellini, F. Rocca, A. Kuzmin, R. Lalendarev, G. Dalba, R. Graziola, J. Purans, D. Pailharey, F. Jandard
Superlattices and Microstructures 39, n° 1-4:267-274 (2006)
2005
Purification and crystallization of tungsten wires fabricated by focused-ion-beam-induced deposition
M. Prestigiacomo, F. Bedu, F. Jandard, D. Tonneau, H. Dallaporta, L. Roussel, P. Sudraud
Applied Physics Letters (2005)10.1063/1.1927714