JEOL JSM-7900F

• 0.6 nm at 15 KV guaranteed
• 0.7 nm at 1KV guaranteed
• 1.0 nm at 0.5kV guaranteed

• 10x to 19.000x in LDF mode
• 60x to 1.000.000x in SEM mode

• 10-12  to  5×10-7 A

• Type : In-Lens Schottky field-emission
• Cathode : ZrO/W
• Accelerating Voltage :
  • from 0.5 to 30 KV (SEM)
  • from 10V (GB/GBSH)

• Secondary electrons : 1 chamber detector (LED) and 2 in-Lens detectors (USD + UED)
• Backscattered electrons : 1 solid-detector (BED) and 1 filterable detector(UED)
• Low Vacuum Mode : variable pressure from 10 to 300Pa with dedicated detectors : 1 secondary eletrons + 1 backscattered electrons
• STEM detector (DEBEN) annular multi-channels (BF, HAADF and DF)
• Photons X : 1 XFlash 6|60 detector (Brüker) usable in Low Vacuum + 1 annular Flat-Quad detector (Brüker)

The Mex (Alicona) software allows to calculate the appropriate angles of inclination for the roughness analysis of a sample according to its nature. Then it allows to perform roughness analysis, 3D modeling, measuring height differences, etc.