JEOL JSM-7900F
Performances
Resolution
- 0.6 nm at 15 KV guaranteed
- 0.7 nm at 1KV guaranteed
- 1.0 nm at 0.5kV guaranteed
Magnification
- 10x to 19.000x in LDF mode
- 60x to 1.000.000x in SEM mode
Probe current
- 10-12 to 5×10-7 A
Emission
- Type : In-Lens Schottky field-emission
- Cathode : ZrO/W
- Accelerating Voltage :
- from 0.5 to 30 KV (SEM)
- from 10V (GB/GBSH)
Detectors
- Secondary electrons : 1 chamber detector (LED) and 2 in-Lens detectors (USD + UED)
- Backscattered electrons : 1 solid-detector (BED) and 1 filterable detector(UED)
- Low Vacuum Mode : variable pressure from 10 to 300Pa with dedicated detectors : 1 secondary eletrons + 1 backscattered electrons
- STEM detector (DEBEN) annular multi-channels (BF, HAADF and DF)
- Photons X : 1 XFlash 6|60 detector (Brüker) usable in Low Vacuum + 1 annular Flat-Quad detector (Brüker)

Roughness analysis / Photogrammetry
The Mex (Alicona) software allows to calculate the appropriate angles of inclination for the roughness analysis of a sample according to its nature. Then it allows to perform roughness analysis, 3D modeling, measuring height differences, etc.
