Thesis defence
Title : “Epitaxial growth and magnetic characterization of Mn5(SixGe1-x)3 thin films on Ge(111)
The board members are :
Rapporteurs:
Laurence Méchin, Directrice de recherche, Laboratoire GREYC (UMR6072) CNRS – ENSICAEN – Université de Caen
Frédéric Chérioux, Directeur de recherche, Femto-St
Présidente :
Christine Robert-Goumet, Professeure, Institut Pascal, Université Clemront-Auvergne
Directeurs de thèse :
Matthieu Petit, Directeur de thèse, Maitre de conférence, CINAM
Jean-Manuel Raimundo, Do-directeur de thèse, Professeur, CINAM
Abstract :
This study investigates the structural and magnetic properties of Mn5(SixGe1-x)3 thin films grown on Ge(111) substrates with silicon concentrations (x) ranging from 0 to 1. Mn5Ge3 on Ge(111) and Mn5Si3 on Si(111) thin films both exhibit a hexagonal D88 (P63/mcm) structure but differ in their magnetic properties, with Mn5Ge3 being ferromagnetic and Mn5Si3 displaying complex anti-ferromagnetic behavior. Given their distinct properties, the ternary system Mn5(SixGe1-x)3 is also of great interest. Due to the limited previous researches only concerned on bulk and polycrystalline Mn5(SixGe1-x)3 system, this study mainly focused on Mn5(SixGe1-x)3 thin films. These crystalline thin films were produced using molecular beam epitaxy through the co-deposition of manganese, germanium, and silicon atoms.