JEOL JSM-6340F Plateform Home JEOL JSM-6340F JEOL JEM- 2010 JEOL JEM- 3010 Performances Resolution 1.2 nm à 15 KV garanti 2.5 nm à 1KV garanti Magnification 25x à 2000x in Low Mag Mode 500x à 650000x in Hight resolution mode Probe current 10-12 à 10-10 A Emission Type : FEG (field emission gun) Cathode : Tungsten Accelerating voltage : 0.5 à 30 KV Detectors Secondary electrons : 2 detector Backscattered electrons : 1 detector X ray : 1 detector
